The relative position of a microscope objective with regard to a sample is essential in imaging the sample using the microscope objective.
The invention describes a method in which monitoring and correcting of a relative position of a microscope objective with regard to a sample is easily realized and does not disturb the primary use of the microscope objective. The procedure is carried out using a test beam directed onto a reflective surface connected to the sample and on the other hand using a test beam directed onto a reflective surface connected to the objective. Both results are registered, evaluated and used for correction.
The invention can be used in high resolution microscopy such e.g. in a STED microscope.
A prototype has been successfully tested in experiments, see figure.
It depicts a microscope 1 including a microscope objective 2. The microscope objective 2 comprises a front lens 3 and a frame 4 holding the front lens 3 and having a metallic surface 5. In the operation of the microscope 1, a beam of excitation light 6 is focused into a sample 7 by means of the front lens 3. The focus of the beam of excitation light 6 is moved along a focal plane of the front lens 3 by means of a scanning device of the microscope 1 , which is not depicted here. The focal plane of the microscope objective 2 only remains fixed with regard to the sample 7, if relative positions of the sample 7 and of a microscope slide 8 and a cover slip 9 between which the sample 7 is fixed remain fixed with regard to the microscope objective 2.
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ultra-high resolution microscopy
increasing spatial resolution
high resolution microscopy
reflective surface connected
test beam directed