Nov. 22, 2016
Transmission Electron Microscopy (TEM) is a technique used for capturing high resolution images of a wide range of materials including macromolecular complexes at near-atomic resolutions. Minimization of astigmatism of the objective lens is a critical task essential for high resolution TEM imaging. However, the most widely used method currently involves visually examining the roundness of a diffractogram (Thon rings) and simultaneously adjusting objective lens stigmators to make the Thon rings as circular as possible. The drawbacks to this method include limited sensitivity for small astigmatism and potential bias caused by the astigmatism of human eyes. Users can spend upwards to 30 minutes making adjustments.
Researchers at Purdue University have developed a system and method that allows for fast and sensitive detection of astigmatism in TEM images. A digital micrograph script allows for such improvements in the readings of astigmatism and allows for real-time feedback to help guide the adjustment of objective lens stigmators and correct the astigmatism of the objective lens. In addition, the script automatically reports the critical imaging parameters by analyzing the Thon Rings. All of this can help improve the accuracy and resolution of TEM imaging.
由于技术保密工作限制，技术信息无法完全展现，请通过邮箱或短信联系我们，获取更多技术资料。
critical task essential
involves visually examining
potential bias caused
technology summary researchers
digital micrograph script
B5, No.1600, North Guoquan Rd, Yangpu, Shanghai
info@yintrust.com
021-65679356
Premium